화학공학소재연구정보센터
Thin Solid Films, Vol.313-314, 795-798, 1998
Spectroscopic ellipsometry of fullerene embedded Langmuir-Blodgett films with surface plasmon excitation
This work presents the first results of an ellipsometric investigation of fullerene embedded Langmuir-Blodgett films with surface plasmon excitation. In contrast to standard ellipsometry, the angle Delta obtained in this way has pronounced features observed at the C-60 transitions.