The growth and structure of W and Fe/W films ranging in thickness from 5 to 150 Angstrom deposited on single-crystal Al2O3(<11(2)over bar 0>) substrates by electron-beam evaporation have been studied by means of low-energy electron-diffraction (LEED) and Auger electron spectroscopy (AES). It has been found that the structure of W films strongly depends on the substrate temperature. In the range 650 K less than or equal to T less than or equal to 1000 K W films grow epitaxially on Al2O3(<11(2)over bar 0>) and show, in particular for films grown from 900 to 1000 K, sharp LEED spots with a bcc(110) orientation. Fe films grown on this W(110) layer exhibit a bcc(110) structure. Preliminary magnetic measurements by SQUID magnetometry indicate strong magnetic anisotropies in the film plane, which further confirm the structural study. The orientation of the magnetization in the film plane has been found to be dependent on Fe film thickness and temperature.