화학공학소재연구정보센터
Thin Solid Films, Vol.342, No.1-2, 4-7, 1999
Probing the surface forces of atomic layered SrTiO3 films by atomic force microscopy
The atomic configuration and chemical properties of two types of SrTiO3 (001) surfaces, SrO or TiO2 terminated surface formed by laser molecular beam epitaxy (MBE), have been investigated using atomic force microscopy (AFM) with a surface modified tip. Both terminated surfaces have a terrace structure consisting of an atomically flat plane and steps of height 4 Angstrom corresponding to the unit cell step. When measured using a TiO2 coated tip, the friction force of the SrO terminated surface was found to be larger than that of the TiO2 terminated surface. This suggests that the friction force is caused by the bonding energy present at the interface, which provides a method for measuring the chemical energy present in oxide materials on the nanometer order between the surface and the tip of an atomic force microscope.