In an attempt to achieve enhanced Raman scattering without metallic thin films, an attenuated total reflection (ATR) arrangement consisting of a prism, amorphous SiO2 gap layer, copper phthalocyanine (CuPc) thin film and fused quartz substrate was constructed. The ATR spectra exhibited sharp dips corresponding to the excitation of electromagnetic normal modes of the multilayer system. Under the excitation of thr modes, Raman scattering from the CuPc film was found to be enhanced by a factor of similar to 10(2) over the normal Raman scattering. Detailed analyses based on electromagnetic theories suggest that the presently observed Raman enhancement is caused by strong electromagnetic fields induced in the CuPc film upon excitation of half-leaky guided modes. The electromagnetic field associated with the HLGM is leaky in the prism, a guided-wave type inside the gap layer and exponentially decays inside the substrate.