The oriented thin film containing ethylenediamine bridged silicon phthalocyanine polymer [PcSi(eda)](n) dispersed in polyvinyl difluoride (PVDF) was fabricated by the electric field orientation. The characterization of the [PcSi(eda)](n)-PVDF oriented thin film by polarized fluorescence, DSC, FTIR reflection absorption spectroscopy (FTIR-RAS), and angle-dependent XPS revealed that the planes of phthalocyanine rings were oriented parallel to the film surface in a perpendicular electric field, while largely 30 degrees with respect to the film surface in a parallel electric field. Combining the ESR analysis, an 'electron channel' by pi-pi orbits in phthalocyanine rings overlapping each Ether may be formed. The photoconductivity studies by photoinduced xerographic discharge technique showed that the photosensitivities of the [PcSi(eda)](n)-PVDF oriented thin films were clearly higher than those of [PcSi(eda)](n)-PVDF thin films coated without an electric field, and varied with the direction of the applied electric field. It was thought that the orientation and the stacking alignment of the [PcSi(eda)](n) molecules in the films might be responsible for the increase of the photoconductivity.