The paper presents results of studies on the structure of MgF2 support, performed using various experimental methods such as XRD, IR, temperature-programmed techniques and low-temperature nitrogen adsorption. MgF2 is characterized by an XRD spectrum with over 40 patterns, which enabled us to follow the changes in crystallite size and internal tension caused by the thermal treatment. TPE-H2O and TG allowed an estimation of the surface OH groups concentration as similar to 3-4 nm(-2).