Journal of Chemical Physics, Vol.115, No.8, 3719-3723, 2001
The application of a vacuum ultraviolet Fourier transform spectrometer and synchrotron radiation source to measurements of the III epsilon(1,0) band of NO
The epsilon (1,0) band of NO was measured at high resolution (0.06 cm(-1)) by the vacuum ultraviolet (VUV) Fourier transform spectrometer from Imperial College, London, using synchrotron radiation at the Photon Factory, KEK, Japan, as a continuum light source. Such resolution facilitates a line by line analysis of the NO epsilon (1,0) band which yields accurate rotational line positions and term values as well as the photoabsorption cross sections. The molecular constants of the D(1) (2) Sigma level are found to be T-0=55 570.582 +/-0.055 cm(-1), B-v=1.979 66 +/-0.000 19 cm(-1), D-v=(5.8 +/-4.7)x10(-5)cm(-1), gamma=-0.127 +/-0.008 cm(-1) and gamma (D)=-(1.03 +/-0.04)x10(-3) cm(-1). The sum of the line strengths for all rotational transitions of the NO epsilon (1,0) band is determined as 2.55x10(-15) cm(2) cm(-1), corresponding to a band oscillator strength of 0.002 88 +/-0.000 17.