The dewetting of low molecular weight sulfonated polystyrene ionomers (SPS) on inorganic silicon oxide substrates is compared with unmodified polystyrene (PS, M-w, = 4000) using a combination of X-ray reflectivity, optical and atomic force microscopy. The amounts of sulfonate group and metal counterion (Li-, Zn2+) were both varied in our study. Unlike unmodified PS, which readily dewets the substrate, a strong inhibition of dewetting occurs for low sulfonation (congruent to 2.3 mol %)!, and no apparent dewetting was found for high sulfonation !(greater than or equal to 7 mol %). For ZnSPS, dewetting was not observed in any of the films, even for those with very low sulfonation. Comparison with bulk rheological data suggests that inter-and intramolecular ionomer complexation may be important in retarding the dewetting process (a nonequilibrium effect), in addition to an increased wettability arising from long-range electrostatic polymer-surface interactions.