Previous Article Next Article Table of Contents Journal of the American Chemical Society, Vol.121, No.20, 4926-4927, 1999 DOI10.1021/ja984454w Export Citation High resolution K capture X-ray fluorescence spectroscopy: A new tool for chemical characterization Bergmann U, Glatzel P, deGroot F, Cramer SP Please enable JavaScript to view the comments powered by Disqus.
