X-ray photoelectron spectroscopy has been used to examine the nature of the oxide overlayers on a passivated cerium metal foil as a function of a variety of oxidation and reduction treatments. Oxidation of a clean uncontaminated cerium(III) oxide surface is facile at room temperature and produces non-stoichiometric ceria (CeO2-x) at oxygen doses as low as 10 L. At higher doses the overlayer thickens, and after a dose of 160 L the layer depth exceeds the Ce 3d photoelectron attenuation distance of about 20 angstrom. High pressure treatment of the foil in oxygen (0.5 bar at RT and 473 K) produces CeO2 in a high degree of crystallographic order such that 0 Is photoelectron intensities are increased above that expected from a randomly oriented powder. An attempt to reduce the CeO2 layer formed by controlled oxidation with CO (633 K, 14 h, 0.6 bar) results in the formation of a carbonated surface layer. Results following attempts to reoxidise this layer are discussed.