With the increasing importance of thin film in various applications, there is a need for new techniques with high surface sensitivity to measure physical properties. In this paper, we report results using a recently developed technique based on atomic force microscopy, temperature-dependent shear modulation force microscopy (SMFM), to investigate the surface glass transition. We test the effects of pressure under the tip, modulation frequency, and driving amplitude, which have been the subject of some controversy. The glass transition measurements on polystyrene and poly(methyl methacrylate) with different sample geometries demonstrate that the active volume probed by this technique has lateral dimensions on the order of the tip-sample contact radius. Applications to thin film glass transition measurements and surface segregation in long-chain/short-chain blends demonstrate the general utility of this technique.