Thin films of Bi2Sr2CaCu2O8+delta have been deposited on (110) oriented SrTiO3 substrates. Two competing growth orientations were observed: domains with the c-axis oriented perpendicular to the substrate surface and domains inclined with the c-axis almost parallel to the [100](s) and [010](s) substrate directions. For both growth orientations, in-plane alignment within the (110)(s) plane has been achieved. Investigations of the substrate-film interface by HREM revealed that the first growth layer at the interface of the c-axis oriented grains is the Bi-O layer. The tilted domains exhibit stacking faults at the substrate-film interface. Domains of the different growth orientations are clearly reflected in the surface morphology of the films.