화학공학소재연구정보센터
Thin Solid Films, Vol.353, No.1-2, 16-19, 1999
Microstructure and crystallographic texture of reactively sputtered FeTaN films
X-ray pole figure analysis is used to measure the crystallographic texture of FeTaN as a function of nitrogen content. The pole figures an used to semi-quantitatively describe the texture with the use of the orientation distribution function. The grain structure and texture is further analyzed with cross-sectional transmission electron microscopy. The preferred crystallographic orientations are found to be mostly randomly oriented, except for fiber textures that range from a (111) for FeTa to a weak (110) for FeTaN. The effect of a Ti underlayer is also described which greatly enhances the (110) fiber texture in all of the films studied.