Previous Article Next Article Table of Contents Thin Solid Films, Vol.366, No.1-2, 306-306, 2000 DOI10.1016/S0040-6090(00)00730-6 Export Citation Surface roughness of oxidized copper films studied by atomic force microscopy and spectroscopic light scattering (vol 325, pg 92, 1998) Ronnow D, Lindstrom T, Isidorsson J, Ribbing CG Please enable JavaScript to view the comments powered by Disqus.
