Cesium-induced structural transformation from the Si(113)3x2 to the 3X1 surface has been investigated by using low energy electron diffraction and synchrotron radiation photoemission spectroscopy. We measured the change of work-function, core level (Si 2p,Cs 4d), and valence band spectra with increasing cesium deposition time. As previously reported, cesium induced the structural transformation from the Si(113)3 X 2 to the 3 x 1 surface at the initial stage of adsorption. Two shoulders (S1,S2) in Si 2p core level and one (SS1) of dangling bond surface states (SS1, SS2) in valence band spectrum from the 3 X 2 surface disappeared with the structural transformation to the 3X1. These results show that surface atoms in sp(2)- and s(2)p(3)-like configurations on the 3 X 2 surface are changed to sp(3)-like ones during the structural transformation. Therefore, the cesium-induced structural transformation seems to be related to the reduction of elastic energy by the donation of valence electrons from cesiums.