Journal of Vacuum Science & Technology B, Vol.19, No.3, 836-842, 2001
Secondary-ion-mass spectrometry and high-resolution x-ray diffraction analyses of GaSb-AlGaSb heterostructures grown by molecular beam epitaxy
Secondary-ion-mass spectrometry and high-resolution x-ray diffraction are used Co investigate AlxGa1-xSb/GaSb heterostructures (0.2