Previous Article Next Article Table of Contents Journal of Materials Science Letters, Vol.20, No.2, 179-181, 2001 DOI10.1023/A:1006752000016 Export Citation An examination of thin film lead scandium tantalum oxide (PST) using piezoAFM Dunn S, De Kroon AP, Whatmore RW Please enable JavaScript to view the comments powered by Disqus.
