Previous Article Next Article Table of Contents Journal of Materials Science Letters, Vol.20, No.8, 699-700, 2001 DOI10.1023/A:1010902806603 Export Citation Temperature dependence of resistance in reactively sputtered RuO2 thin films Tong KY, Jelenkovic V, Cheung WY, Wong SP Please enable JavaScript to view the comments powered by Disqus.
