Current Status of the Synchrotron Small-Angle X-ray Scattering Station BL4C1 at the Pohang Accelerator Laboratory

J"org Bolze; Jehan Kim; Jung-Yun Huang; Seungyu Rah; Hwa Shik Youn; Byeongdu Lee; Tae Joo Shin; Moonhor Ree

Macromolecular Research, Vol.10, No.1, 2-12, February, 2002

J"org Bolze, Jehan Kim, Jung-Yun Huang, Seungyu Rah, Hwa Shik Youn^†, Byeongdu Lee¹, Tae Joo Shin¹, and Moonhor Ree^{1, †}

Pohang Accelerator Laboratory, Pohang University of Science and Technology, San 31, Hyoja-dong, Pohang 790-784, Korea
¹Dept. of Chemistry, Center for Integrated Molecular Systems, BK21 Functional Polymer Thin Film Group,and Polymer Research Institute, Pohang University of Science and Technology, San 31, Hyoja-dong, Pohang 790-784, Korea

E-mail:,

The small-angle X-ray scattering (SAXS) beamline BL4C1 at the 2.5 GeV storage ring of the Pohang Accelerator Laboratory (PAL) has been in its first year of operation since August 2000. During this first stage it could meet the basic requirements of the rapidly growing domestic SAXS user community, which has been carrying out measurements mainly on various polymer systems. The X-ray source is a bending magnet which produces white radiation with a critical energy of 5.5 keV. A synthetic double multilayer monochromator selects quasi-monochromatic radiation with a bandwidth of ca. 1.5%. This relatively low degree of monochromatization is sufficient for most SAXS measurements and allows a considerably higher flux at the sample as compared to monochromators using single crystals. Higher harmonics from the monochromator are rejected by reflection from a flat mirror, and a slit system is installed for collimation. A charge-coupled device (CCD) system, two one-dimensional photodiode arrays (PDA) and imaging plates (IP) are available as detectors. The overall performance of the beamline optics and of the detector systems has been checked using various standard samples. While the CCD and PDA detectors are well-suited for diffraction measurements, they give unsatisfactory data from weakly scattering samples, due to their high intrinsic noise. By using the IP system smooth scattering curves could be obtained in a wide dynamic range. In the second stage, starting from August 2001, the beamline will be upgraded with additional slits, focusing optics and gas-filled proportional detectors.

Keywords:synchrotron X-ray;small-angle X-ray scattering;beamline

[References]

Guinier A, Fournet G, Small Angle Scattering of X-rays, Chapman & Hall, London (1955)
Glatter O, Kratky O, Small Angle X-ray Scattering, Academic Press, London (1982)
Feigin LA, Svergun DI, Structure Analysis by Small-Angle X-ray and Neutron Scattering, Plenum Press, New York (1987)
Brumberger H, Modern Aspects of Small-Angle Scattering, Kluwer Academic Press, Dordrecht (1995)
Roe RJ, Methods of X-ray and Neutron Scattering in Polymer Science, Oxford Univ. Press, Oxford (2000)
Doniach S, Chem. Rev., 101(6), 1763 (2001)
Cebe P, Hsiao BS, Lohse DJ, Scattering from Polymers: Characterization by X-rays, Neutrons and Light, ACS Symposium Series 739, Oxford Univ. Press, and further references given therein (1999)
Chu B, Hsiao BS, Chem. Rev., 101(6), 1727 (2001)
Lee TY, Choi J, Chung Y, Huang JY, Lee JM, Nam SH, Youn HS, Nucl. Inst. Methods Phys. Res. A, 467-468, 47 (2001)
Ree M, Woo SH, Shin TJ, Polym. Sci. Technol., 8(1), 57 (1997)
Dingenouts N, Bolze J, Potschke D, Ballauff M, Adv. Polym. Sci., further references given therein, 144, 1 (1999)
Hammersley AP, Svensson SO, Thompson A, Graafsma H, Kvick A, Moy J, Rev. Sci. Instr., 66, 2729 (1995)
Gilbert RG, Emulsion Polymerization, Academic Press, London (1995)
Dingenouts N, Ballauff M, Langmuir, 15(9), 3283 (1999)
Fujisawa T, Inoko Y, Yagi N, J. Synchr. Rad., 6, 1106 (1999)
Dingenouts N, Rontgenkleinwinkelstreuung als Methodik der Strukturanalyse teilgeordneter Systeme, Shaker Verlag, Aachen (1999)
Lee SW, Lee B, Ree M, Macromol. Phys. Chem., 201, 453 (2000)
Strobl GR, Schneider M, J. Polym. Sci., 18, 1343 (1980)
Norby P, J. Appl. Cryst., 30, 21 (1997)
Ree M, Woo SH, Kim K, Chang H, Zin WC, Lee KB, Park YJ, Macromol. Symp., 118, 213 (1997)
Shin TJ, Lee B, Youn HS, Lee KB, Ree M, Langmuir, 17(25), 7842 (2001)

[Referenced By]

[1] Guinier A, Fournet G, Small Angle Scattering of X-rays, Chapman & Hall, London (1955)

[2] Glatter O, Kratky O, Small Angle X-ray Scattering, Academic Press, London (1982)

[3] Feigin LA, Svergun DI, Structure Analysis by Small-Angle X-ray and Neutron Scattering, Plenum Press, New York (1987)

[4] Brumberger H, Modern Aspects of Small-Angle Scattering, Kluwer Academic Press, Dordrecht (1995)

[5] Roe RJ, Methods of X-ray and Neutron Scattering in Polymer Science, Oxford Univ. Press, Oxford (2000)

[6] Doniach S, Chem. Rev., 101(6), 1763 (2001)

[7] Cebe P, Hsiao BS, Lohse DJ, Scattering from Polymers: Characterization by X-rays, Neutrons and Light, ACS Symposium Series 739, Oxford Univ. Press, and further references given therein (1999)

[8] Chu B, Hsiao BS, Chem. Rev., 101(6), 1727 (2001)

[9] Lee TY, Choi J, Chung Y, Huang JY, Lee JM, Nam SH, Youn HS, Nucl. Inst. Methods Phys. Res. A, 467-468, 47 (2001)

[10] Ree M, Woo SH, Shin TJ, Polym. Sci. Technol., 8(1), 57 (1997)

[11] Dingenouts N, Bolze J, Potschke D, Ballauff M, Adv. Polym. Sci., further references given therein, 144, 1 (1999)

[12] Hammersley AP, Svensson SO, Thompson A, Graafsma H, Kvick A, Moy J, Rev. Sci. Instr., 66, 2729 (1995)

[13] Gilbert RG, Emulsion Polymerization, Academic Press, London (1995)

[14] Dingenouts N, Ballauff M, Langmuir, 15(9), 3283 (1999)

[15] Fujisawa T, Inoko Y, Yagi N, J. Synchr. Rad., 6, 1106 (1999)

[16] Dingenouts N, Rontgenkleinwinkelstreuung als Methodik der Strukturanalyse teilgeordneter Systeme, Shaker Verlag, Aachen (1999)

[17] Lee SW, Lee B, Ree M, Macromol. Phys. Chem., 201, 453 (2000)

[18] Strobl GR, Schneider M, J. Polym. Sci., 18, 1343 (1980)

[19] Norby P, J. Appl. Cryst., 30, 21 (1997)

[20] Ree M, Woo SH, Kim K, Chang H, Zin WC, Lee KB, Park YJ, Macromol. Symp., 118, 213 (1997)

[21] Shin TJ, Lee B, Youn HS, Lee KB, Ree M, Langmuir, 17(25), 7842 (2001)