감마선을 이용한 가동 중 증류탑 진단실험

정성희; 김종범; 진준하; Sung Hee Jung; Jong Bum Kim; Joon Ha Jin

Journal of the Korean Industrial and Engineering Chemistry, Vol.13, No.1, 19-24, February, 2002

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감마선을 이용한 가동 중 증류탑 진단실험

Diagnosis of Chemical Processing Column Using Gamma Ray Scanning Technique

정성희^†, 김종범, 진준하

RI 방사선응용연구팀 한국원자력연구소

Sung Hee Jung^†, Jong Bum Kim, and Joon Ha Jin

Radioisotepe and Radiation Application Team, Korea Atomic Energy Research Institute, Korea

E-mail:

초록

화학반응 공정시설의 문제점 해결을 위하여 방사선 및 방사성동위원소를 이용한 진단 기술들이 개발되고 널리 사용되어 왔다. 방사선 이용기술은 가동 중인 시설에 대해서 영향을 미치지 않고 정확한 결과를 얻을 수 있는 장점이 있다. 본 연구에서는 가동 중 이상현상을 보이는 증류탑에 대하여 밀봉 감마선원(Co-60)을 이용하여 on-line으로 내부 구조물의 상태 및 이상현상의 원인과 그 정도를 파악하기 위한 실험을 수행하였다. 감마선 진단 결과 얻은 density profile로부터 일부 tray에서 flooding 현상이 관찰되었다. 또, 가동을 중지하고 내부가 비워진 상태(dry scan)와 보수 후 정상가동 상태(reference scan)에서 각각의 density profile을 측정하여 향후 유사한 이상 발생시 중요한 참고자료로 사용할 수 있게 되었다.

Since 1960s, process diagnostic tools using gamma radiation and radioisotope have been continuously developed and widely applied to various kinds of troubleshooting for process units and reaction vessels without shutting them down. In this study, a gamma scanning technique using radiation via sealed gamma source (Co-60) was carried out, on-line, in order to investigate the internal situation and the possible causes of malfunction of a process column during its operation. The density profile obtained from the gamma ray scanning data showed abnormal phenomena on some parts of trays. To solve the problems observed from this scanning, during the shut down period, the column was re-scanned to study its capacity and efficiency by means of precise level of liquid phase on each tray. After the column has been restarted to the normal condition, the scanning was repeated. The collected scan data served as an important reference for troubleshooting any abnormality in the future operations

Keywords:gamma radiation;column scanning;density profile;sealed source;column

[References]

Chakhovskoi AG, Kesling WD, Trujillo JT, Hunt CE, J. Vac. Sci. Technol. B, 12(2), 785 (1994)
Shea LE, Datta RK, Brown JJ, J. Electrochem. Soc., 141(8), 2198 (1994)
Ravichandran D, Roy R, White WB, Erdei S, J. Mater. Res., 12(3), 819 (1997)
Kutty TRN, Jagannathan R, Rao RP, Mater. Res. Bull., 25, 1355 (1990)
Ravichandran D, Roy R, Ravindranathan P, White WB, J. Am. Ceram. Soc., 82(4), 1082 (1999)
Bhattacharya D, Pathk LC, Mishra SK, Sen D, Chopra KL, Appl. Phys. Lett., 57(20), 2145 (1990)
Yu YT, Kim BG, Nam CW, Korean J. Mater. Res., 8(11), 999 (1998)
Blasse G, Bril A, Philips Res. Repts., 23, 201 (1968)
Lee YK, Kim JY, Kim BG, Yu YT, Korean J. Mater. Res., 8(8), 737 (1998)
Matsuzawa T, Aoki Y, Takeuchi N, Murayama Y, J. Electrochem. Soc., 143(8), 2670 (1996)
Takasaki H, Tanabe S, Hanada T, J. Ceram. Soc., 104, 322 (1996)
Katsumata T, Nabae T, Sasajima K, Komuro S, Morikawa T, J. Electrochem. Soc., 144(9), L243 (1997)

[Referenced By]

[1] Chakhovskoi AG, Kesling WD, Trujillo JT, Hunt CE, J. Vac. Sci. Technol. B, 12(2), 785 (1994)

[2] Shea LE, Datta RK, Brown JJ, J. Electrochem. Soc., 141(8), 2198 (1994)

[3] Ravichandran D, Roy R, White WB, Erdei S, J. Mater. Res., 12(3), 819 (1997)

[4] Kutty TRN, Jagannathan R, Rao RP, Mater. Res. Bull., 25, 1355 (1990)

[5] Ravichandran D, Roy R, Ravindranathan P, White WB, J. Am. Ceram. Soc., 82(4), 1082 (1999)

[6] Bhattacharya D, Pathk LC, Mishra SK, Sen D, Chopra KL, Appl. Phys. Lett., 57(20), 2145 (1990)

[7] Yu YT, Kim BG, Nam CW, Korean J. Mater. Res., 8(11), 999 (1998)

[8] Blasse G, Bril A, Philips Res. Repts., 23, 201 (1968)

[9] Lee YK, Kim JY, Kim BG, Yu YT, Korean J. Mater. Res., 8(8), 737 (1998)

[10] Matsuzawa T, Aoki Y, Takeuchi N, Murayama Y, J. Electrochem. Soc., 143(8), 2670 (1996)

[11] Takasaki H, Tanabe S, Hanada T, J. Ceram. Soc., 104, 322 (1996)

[12] Katsumata T, Nabae T, Sasajima K, Komuro S, Morikawa T, J. Electrochem. Soc., 144(9), L243 (1997)