화학공학소재연구정보센터
Thin Solid Films, Vol.405, No.1-2, 42-49, 2002
Deposition and characterisation of NbxC60 films
NbxC60 films have been deposited at 100 degreesC by co-evaporation of Nb and C-60 under ultrahigh vacuum conditions. In situ Xray photoelectron spectroscopy analyses of films with a low Nb content showed peak shifts and changes in the C Is shake-up satellites that are consistent with the formation of a niobium fulleride phase. Higher Nb contents (x > 5.5) lead to a decomposition of C-60 and the formation of NbC The films were rather stable in air and could be analysed ex situ with different techniques. Analyses with Raman spectroscopy showed many additional lines, which were attributed a new fulleride phase Nb7C60 co-existing with unreacted C-60. The amount of unreacted C-60 in the films can be reduced by dissolving in toluene. but cannot be completely excluded. X-Ray diffraction analysis showed very poor crystallinity of the films. nevertheless, it is possible to attribute the diffraction patterns observed to a cubic structure with a slightly reduced cell parameter compared to C-60. The Nb7C60 shows similarities to previously reported polymeric PdxC60 and PtxC60.