The surface patterns resulting from fast crystallization of as-cast and annealed thin films (ca. 100 nm) of two polystyrene-b-polybutadieneb-poly(e-caprolactone) ABC triblock copolymers is investigated through atomic force microscopy (AFM). Two different substrates are used: silicon and mica. The behaviour is compared with the bulk morphology obtained through transmission electron microscopy (TEM). AFM images of the as-cast films revealed surfaces with lamellar patterns. Based on the observation of T-shaped grain boundaries between lamellae, and on a comparison of the microdomain dimensions obtained by TEM and AFM, the surface pattern is rationalized as being formed by amorphous and crystalline polycaprolactone (PCL), with the PCL/PB block copolymer interfaces located parallel to the susbstrate. The formation of islands and holes in annealed films with a lamellar 'floor', depending on the conmensurability between film thickness and long period, is also observed, indicating a parallel orientation of the block copolymer lamellae.