Previous Article Next Article Table of Contents Journal of Materials Science Letters, Vol.21, No.17, 1379-1383, 2002 DOI10.1023/A:1019781019560 Export Citation Qualitative X-ray diffraction analysis of residual stresses in NdNiO3 thin films with metal-insulator transition Zaghrioui M, Laffez P, Goudeau P, Thiaudiere D Please enable JavaScript to view the comments powered by Disqus.
