Journal of Vacuum Science & Technology B, Vol.21, No.1, 130-134, 2003
Electromagnetic characterization of nanoimprint mold inspection
The electromagnetic effects of opaque mold materials in exposure, and complementary mask inspection in the innovative nanoimprint technique of White and Wood are explored through simulation. For a wavelength of 365 nm and 40 nm features in an opaque layer,with 10% transmission, an extinction coefficient of more than 3 is important for a high transmission in the open features and a refractive index larger than 2 is also useful. For complementary mask inspection the leakage is largest for the polarization perpendicular to the edge and depends on edge length. The leakage is not a strong function of misalignment and rises less than linearly, with the separation between the facing surfaces of the two masks. Defects one-third of a feature size are one-twentieth of a wavelength in size, and with filtering of the radiated spectrum can contribute up to 10% of the signal associated with leakage from a complete feature. (C) 2003 American Vacuum Society.