In this paper we present the results of photoelectric work function measurements for carbonaceous films containing Ni nanocrystals. The investigated films were obtained by thermal vacuum deposition method. The structure of films was studied by electron diffraction, transmission microscopy and Raman spectroscopy. Film structure depends on Ni contents in the film volume. Work function determined from photoelectric measurements for all investigated films are similar and lie in the range of 2.65-2.93 eV The decrease of work function value with the cleaning of the film's surface with UV pulsed laser beam was observed.