We developed a procedure for a direct evaluation of light scattering patterns registered during an isothermal crystallization of s-polypropylene. Analysis is based on the determination of three parameters of the scattering curve for both, polarized and depolarized measuring conditions: (i) the forward scattering intensity I(q --> 0) (ii) the width Deltaq of the intensity distribution (iii) the integral intensity in the registration plane, Q(2). We derive equations for these parameters and relate them to the size and the inner structure of the hedrites which develop in s-polypropylene during a crystallization. (C) 2003 Elsevier Ltd. All rights reserved.