Previous Article Next Article Table of Contents Journal of the American Chemical Society, Vol.126, No.13, 4084-4085, 2004 DOI10.1021/ja049726b Export Citation Structural characterization of a pentacene monolayer on an amorphous SiO2 substrate with grazing incidence X-ray diffraction Fritz SE, Martin SM, Frisbie CD, Ward MD, Toney MF [Referenced By] Please enable JavaScript to view the comments powered by Disqus.
