화학공학소재연구정보센터
Journal of Colloid and Interface Science, Vol.269, No.2, 329-335, 2004
Atomic force microscopy imaging of hair: correlations between surface potential and wetting at the nanometer scale
We report investigations of hair surface potential under wetting at the nanometric scale by atomic force microscopy (AFM). Surface potential imaging was used to characterize the electrostatic properties of the hair samples. We found that the surface potential noticeably increases along the edges of the cuticles. These results are correlated with wetting behavior of different liquids performed using AFM in noncontact mode. (C) 2003 Elsevier Inc. All rights reserved.