Previous Article Next Article Table of Contents Journal of Materials Science, Vol.39, No.7, 2609-2612, 2004 DOI10.1023/B:JMSC.0000020040.77683.20 Export Citation Characterization of sputtered NiO films using XRD and AFM Hotovy I, Huran J, Spiess L Please enable JavaScript to view the comments powered by Disqus.
