Previous Article Next Article Table of Contents Journal of Materials Science, Vol.39, No.9, 3199-3200, 2004 DOI10.1023/B:JMSC.0000025858.30792.bf Export Citation Transmission electron microscopy investigation of the interface formation between silicon and anodic alumina Muller F, Muller AD, Schulze S, Hietschold M Please enable JavaScript to view the comments powered by Disqus.
