We describe the use of evanescent wave scattering to measure the separation between the surface of a solid and a particle that is attached to an atomic force microscope (AFM) cantilever. Termed evanescent wave atomic force microscopy, our approach involves measuring the intensity of the light scattered from an evanescent field formed by the total internal reflection of a laser beam at a solid/fluid interface. In a conventional AFM "colloid probe" measurement, this separation must be inferred from an examination of the surface forces. Direct measurement of this separation with an evanescent wave atomic force microscope (EW-AFM) removes some ambiguity in the surface force measurement and, in addition, allows new types of measurements. For example, the force can be monitored at a constant separation. Our evanescent scattering apparatus is essentially identical to that used in total internal reflection microscopy (TIRM), except that we collect the light that scatters back into the incident medium, because the AFM partly obscures the forward scattered light (i.e., light scattered into the transmitted region). Compared to a conventional TIRM measurement, where the particle moves freely, attaching the particle to the cantilever in an EW-AFM gives much greater control of the particle position.