Schottky contacts were fabricated on composites of high molecular weight polyaniline and pristine multiwalled carbon nanotubes. Physical and electrical characteristics of these organic composite materials were studied by using atomic force microscopy (AFM), scanning electron microscopy (SEM), and electrical measurements. The RMS surface roughness of the composite films was found to be 4 nm. From the IV characteristics of these composite devices, it appears that the current follows Ohm's law at lower voltages and Child's law at higher voltages, indicating a space-charge-limited emission mechanism in the presence of a distribution of shallow traps.