The Mueller matrices describing oblique incidence reflection and normal incidence transmission have been measured for sculptured thin films (STFs) by glancing angle deposition with simultaneous substrate rotation. In data reduction, the 15 parameters of the (1,1)-normalized real Mueller matrix are converted to the six parameters of the (2,2) -normalized complex Jones matrix. Two computational methods yield excellent agreement in the real and imaginary parts of the complex amplitude ratios rho(ps) and rho(sp) obtained in reflection (or tau(ps) and tau(sp) obtained in transmission). Multilayer optical analysis has been developed that employs step-wise variations of the principal axis Euler angles, associated with the local uniaxial structure in successive sublayers, in order to simulate variations in the column orientation with depth into the film. Such analysis has elucidated the Bragg resonance characteristics exhibited by the optical rotation of chiral STFs. (C) 2003 Elsevier B.V. All rights reserved.