Chemical Engineering & Technology, Vol.21, No.3, 253-260, 1998
On-line characterization of submicron particles from high concentration sources via mobility analysis
Ising differential electrical mobility analysis in combination with an effective dilution system, the authors report a simple and rapid method for on-line characterization of very concentrated sources of submicron particles in a high temperature environment such as soot or TiO2 pigment production. Accuracy and error sources of this approach are discussed.