화학공학소재연구정보센터
Thin Solid Films, Vol.484, No.1-2, 100-103, 2005
Obtaining of polycrystalline CdTeO3 by reactive pulse laser deposition
We report the obtaining of as-grown polycrystalline CdTeO3 thin films grown by the reactive pulsed laser deposition technique in a controlled atmosphere of pure oxygen. X-ray diffraction (XRD) shows no CdTe presence and peaks, corresponding to single-phase of face-centred cubic of polycrystalline CdTeO3, are well-defined, with a calculated gain size of about 120 nm and a compressive strain of 0.083%. X-ray photoelectron spectroscopy (XPS) shows 11% of CdTe and 89% of CdTeO3. This CdTe, which was not present in XRD measurements, was related with Te reduction in the surface during the XPS measurement. Atomic force microscopy shows a mainly smooth surface with spheroid-like grains. (c) 2005 Elsevier B.V. All rights reserved.
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