The surface of UV-cured films of poly(ethylene glycol) diacrylate (PEGAc)/tetrahydrofurfuryl acrylate (THFAc) (weight ratio 100/0, 90/10, and 80/20) was metallized by the reduction of polymer-incorporated cobalt chloride with aqueous sodium borohydride at 20 degrees C. The electron probe microanalysis (EPMA) and X-ray photoelectron spectroscopy measurement revealed that the cobalt ion, which was homogeneously distributed in the inner part of the film before reduction, migrated to both sides of the film, and then reduced to pure metal by the reduction treatment. The surface resistance of the UV-cured PEGAc/THFAc film increased with increasing THFAc content. Especially, the trend was prominent at the glass side of the metallized films. The glass transition temperature of the cured resin measured by dynamic viscoelastic analysis slightly rose with an increase of THFAc content. The EPMA map of cobalt and carbon in the depth direction of the metallized film showed that the cobalt layer, generated at the glass side of the film with a higher THFAc content, contains more polymer component, in agreement with the order of surface resistance. The X-ray diffraction analysis of the reduced films revealed that the degree of crystallinity of the generated cobalt was low. (c) 2005 Wiley Periodicals, Inc.