Chemical Reviews, Vol.97, No.4, 1017-1044, 1997
Cross-Sectional Scanning-Tunneling-Microscopy
Keywords:MOLECULAR-BEAM-EPITAXY;MULTIQUANTUM WELL STRUCTURE;III-V-HETEROSTRUCTURES;ELECTRONIC SURFACE PROPERTIES;SHORT-PERIOD SUPERLATTICES;SILICON PN-JUNCTIONS;X-RAY-DIFFRACTION;INAS/GASB SUPERLATTICES;CAPACITANCE MICROSCOPY;SI(111)2X1 SURFACE