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Chemical Reviews, Vol.97, No.4, 1195-1230, 1997
Nanometer-Scale Surface Modification Using the Scanning Probe Microscope - Progress Since 1991
Keywords:ATOMIC-FORCE-MICROSCOPE;TIP-INDUCED ANODIZATION;CHEMICAL-VAPOR-DEPOSITION;ELECTRON-BEAM LITHOGRAPHY;FIELD-EFFECT TRANSISTORS;SILICON 100 SURFACES;LANGMUIR-BLODGETT-FILMS;TUNNELING-MICROSCOPE;ELECTROCHEMICAL MICROSCOPE;SI(100) SURFACES