The texture development of PEN films with different semicrystalline morphologies have been studied by X-ray diffraction. These different structures have been obtained by uniaxially stretching PEN amorphous films at 100 and 160 degrees C (below and above T-g) at different drawing ratios. Samples have also been characterized by DSC to determine the crystallinity ratios, the crystallization, and melting temperatures. To define the orientation of crystallites in the oriented samples, pole figures have been constructed, as a function of temperature and drawing ratio (DR) in the range 1.5-4. In the range from DR = 2 to 4 the orientation is clearly uniplanar-axial. At T-draw = 100 degrees C the crystallinity shown by DSC analysis is higher than the sample stretched at 160 degrees C. The orientation is also higher when samples are stretched at 100 degrees C. The naphthalene rings mainly stay in the plane of the film with a lower fraction perpendicular to the plane of the film. (C) 2006 Wiley Periodicals, Inc. J Appl Polym Sci 103: 395-401, 2007