A simple and effective method for reactivation of H2S poisoned Pt-anodes is described and the feasibility of the method was examined by single cell tests and 1 kW stack tests. The performance of the H2S poisoned Pt-anode can be basically recovered by applying a high voltage pulse (1.5 V for 20 s) followed by a low voltage pulse (0.2 V for 20 s) in a single cell. During the 10 poisoning-recovery cycles, the ohmic resistance and electrochemical surface area did not change significantly. The I kW stack tests show that the stack performance decayed severely and the maximum power decreased to 0.366 kW (32% of the original value) after exposure to 18 ppm H2S/H-2 for 2 h at 600 mA cm(-2). The stack performance can be significantly recovered by applying a high voltage pulse (1.5 V for 2 min) followed by a low voltage pulse (0.2 V for 2 min) to each cell. The maximum power recovered to 1.095 kW (97.5% of the original value). (c) 2007 Elsevier B.V. All rights reserved.