The radiative recombination in GaInNAs/GaAs quantum well structures was investigated by low temperature optical spectroscopy. In the temperature region, below 100 K, we found that the observed transition energies strongly depend on the excitation intensity and the temperature, which is indicative of carrier localization. The degree of carrier localization depends on the In-concentration but is not significantly influenced by the N-concentration when the N-concentration exceeds 1.6%. Photolurninescence studies indicate that the degree of the carrier localization decreases with increasing In-concentration at a constant N-concentration. In addition, the experimental results show that carrier localization is strongly correlated to deep level emission. Through post-growth thermal treatment at 650 degrees C both carrier localization and deep level emission can be eliminated. (c) 2006 Elsevier B.V. All rights reserved.