The crystalline morphology of poly(ethylene 2,6-naphthalate) (PEN) film obtained by uniaxial stretching at 145 degrees C (T-g + 25 degrees C) was investigated by use of a light scattering photometer equipped with a CCD camera system. The Hv scattering showed a symmetric, circular pattern at a low stretch ratio of lambda < 3. The intensity profile became sharper with an increase in lambda, suggesting that anisotropic crystal rods are randomly assembled and that the length of the rods increases with lambda. At a high stretch ratio of lambda >= 3, a double-cross-type pattern consisting of a broad rod-like pattern and sharp cross streaks was observed. The rod-like pattern became smaller and the streaks became sharper with an increase in lambda. By the model calculation of the scattering pattern, the double-cross-type pattern is explained by the stacking of anisotropic crystal rods oriented in the stretch direction. As lambda increases, the thickness of the rods and the number per stack increase, and the stacks and rods are slightly oriented in the stretch direction. The change in the wide angle X-ray diffraction pattern suggested that the ordering of the molecular chain in the crystal rods increases with increasing lambda. (C) 2007 Elsevier Ltd. All rights reserved.