화학공학소재연구정보센터
Chemical Physics Letters, Vol.330, No.3-4, 226-230, 2000
Imaging ultrathin Al2O3 films with scanning tunneling microscopy
Reproducible scanning tunneling microscopic (STM) images were obtained from ultrathin Al2O3 films epitaxially grown on Re(0001). Initially, the oxide films grow two-dimensionally in a layer-by-layer fashion with well-ordered surface morphologies. As the oxide film thickens to ca. 9 monolayer equivalents (MLE), the surface roughens and becomes more disordered yet still exhibits significant long-range, hexagonal periodicity as indicated by low energy electron diffraction (LEED). Because of limited conductivity, films thicker than ca. 9 MLE could not be imaged.