X-ray topography was used in an effort to understand the relationship between microstructure and fracture strength in single-crystal sapphire bend bars. The bars were indistinguishable using standard optical characterization techniques, but X-ray diffraction topography revealed that they could be separated into two distinct types. The first type had an oriented microstructure consisting of a pattern of linear features parallel to the long axis of the bars. This microstructure was attributed to fabrication damage. The second type was well-polished, nearly damage-free sapphire. Fracture strength data showed that the damaged bars had strengths less than 70% of the bars without damage.