Lead lanthanum zirconate titanate (PLZT) thick films were deposited on a glass substrate using a methoxyethanol-based sol-gel multicoating method. Two types of electrodes, a coplanar surface electrode and an embedded electrode, were deposited on the films to measure the phase retardation of the PLZT films by the Senarmont method. The quadratic electrooptic properties were measured as a function of the film thickness, for thicknesses ranging from 1 to 4 mum. The PLZT film with the embedded electrode structure showed a higher phase retardation value and enhanced electric breakdown resistance.