Journal of the American Ceramic Society, Vol.90, No.1, 322-326, 2007
Dielectric relaxation in layer-structured SrBi2-xNdxNb2O9 ceramics (x=0, 0.05, 0.2, 0.35)
SrBi2-xNdxNb2O9 (x=0, 0.05, 0.2, 0.35) ceramics were synthesized by the traditional solid-state sintering method. X-ray diffraction analysis showed that single-phase-layered perovskites were obtained for all compositions. The substitution of Nd3+ for Bi3+ induced a relaxor behavior of frequency dispersion for Nd-doped SrBi2Nb2O9.The parameter of frequency dispersion Delta T-m, which is the T-m between 1 kHz and 1 MHz, increases from 0 degrees C for x=0 to 13 degrees C for x=0.35, and the degree of relaxor behavior gamma increases from 0.96 for x=0 to 2.02 for x=0.35. The temperature of the maximum dielectric constant T-m decreases linearly with an increase in the Nd content (x).