Materials Chemistry and Physics, Vol.81, No.2-3, 233-236, 2003
The software tool for lattice parameters determination from nanoareas using CBED patterns
The higher-order Laue zone lines often visible in the central discs of convergent-beam electron diffraction patterns are sensitive to small changes in the lattice parameters in nanoareas. A computer program for the determination of the lattice parameters in the regions of the deformed lattice, especially near to an interface, is presented. (C) 2002 Elsevier Science B.V. All rights reserved.
Keywords:composite materials;electron diffraction;computer modelling and simulation;CBED;lattice parameter determination