To study the influence of the growth parameters on structural properties and crystal quality epitaxial layers of AlN and AlxGa1-xN (x = 0 1) were grown in an RF-plasma enhanced MBE-system on Si-terminated (00.1) SIC, (00.1) sapphire and (! 1 1) Si substrates by varying substrate temperature, growth rate and III/V ratio. The alloy composition of the AlxGa1-xN layers was studied by RBS-measurements and the results were compared with X-ray diffraction and with the optical properties obtained from cathodoluminescence ICL). The formation of an AlxGa1-xN superstructure is observed with ordered Al and Ga distribution. Increasing degree of chemical ordering is observed with increasing growth temperature. The CL-spectra at 77 It show relatively sharp near-band-edge transitions for pure AlN and Ga-rich compositions indicating high material quality. The near-band-edge transition follows the composition of the solid solution connected with a broadening of the peaks and evident optical bowing for samples grown at low growth rates (< 0.35 mum/h). A decrease of the bowing parameter is observed for the entire range of alloy composition by increasing the growth rate.