Journal of Crystal Growth, Vol.253, No.1-4, 398-403, 2003
Growth of a new ordered langasite structure compound Ca3TaGa3Si2O14 single crystal
A newly ordered piezoelectric single crystal Ca3TaGa3Si2O14 (CTGS) with langasite structure had been successfully grown with the dimensions of 16-14 mm in diameter and 37 mm in length using the Czochralski technique. The X-ray powder diffraction (XRPD) of different parts of the single crystal was performed at room temperature. Lattice parameters had been computed from single crystal XRPD peak values. The composition of the grown crystal had been studied by X-ray fluorescence analysis. Differential thermal analysis and thermal gravity analysis had been carried out and found that the CTGS crystal started to melt at 1185degreesC and the peak was at 1368degreesC. (C) 2003 Elsevier Science B.V. All rights reserved.
Keywords:crystal structure;X-ray diffraction;Czochralski method;gallium compounds;piezoelectric materials;filters