The growth of type-II textured tungsten disulfide (WS2) thin films by solid state reaction between the spray deposited WO3 and gaseous sulfur vapors with Pb interfacial layer has been studied. X-ray diffraction (XRD) technique is used to measure the degree of preferred orientation 'S' and texture of WS2 films. Scanning electron microscopy (SEM) and transmission electron microscopy techniques have been used to examine the microstructure and morphology. The electronic structure and chemical composition were studied using X-ray photoelectron spectroscopy (XPS). The use of Pb interfacial layer for the promotion of type-II texture in WS2 thin films is successfully demonstrated. The presence of (003, (where l= 1, 2, 3,...) family of planes in the XRD pattern indicates the strong type-II texture Of WS2 thin films. The crystallites exhibit rhombohedral (3R) structure. The large value of 'S' (1086) prompts the high degree of preferred orientation as well. The stratum of crystallites with their basal plane parallel to the substrate surface is seen in the SEM image. The EDS and XPS analyses confirm the tungsten to sulfur atomic ratio as 1:1.75. We purport that Pb interfacial layer enhances type-II texture Of WS2 thin films greatly. (c) 2006 Elsevier B.V. All rights reserved.